Matthew S. Hunt, PhD: Difference between revisions
Jump to navigation
Jump to search
No edit summary |
No edit summary |
||
| Line 1: | Line 1: | ||
__NOTOC__ | |||
{{StaffMemberInfobox | {{StaffMemberInfobox | ||
|StaffName = Matthew S. Hunt, PhD | |StaffName = Matthew S. Hunt, PhD | ||
| Line 10: | Line 11: | ||
}} | }} | ||
== About == | == About == | ||
Matthew Hunt is the Assistant Director of Staff Research and Lead Microscopist for The Kavli Nanoscience Institute at the California Institute of Technology. He directs research projects that are carried out by KNI technical staff, in conjunction with undergraduate researchers, with the purpose of creating new nanofabrication techniques using the KNI's leading edge instrumentation. He also manages the KNI's suite of microscopy equipment: transmission electron microscopes, scanning electron microscopes, focused ion beam systems, and an atomic force microscope. | Matthew Hunt is the Assistant Director of Staff Research and Lead Microscopist for The Kavli Nanoscience Institute (KNI) at the California Institute of Technology. He directs research projects that are carried out by KNI technical staff, in conjunction with undergraduate researchers, with the purpose of creating new nanofabrication techniques using the KNI's leading edge instrumentation. He also manages the KNI's suite of microscopy equipment: transmission electron microscopes, scanning electron microscopes, focused ion beam systems, and an atomic force microscope. | ||
Matt joined the KNI in 2014 after completing his PhD related to the high temperature oxidation of turbine engine materials, through which he developed expertise in a number of electron, ion and x-ray microscopy techniques. His research interests lie in the development of new lithography and microscopy techniques that utilize various beam species (e.g. helium ions, neon ions, electrons) and the application thereof to the kinds of novel materials and devices that are important to users of the KNI. | Matt joined the KNI in 2014 after completing his PhD related to the high temperature oxidation of turbine engine materials, through which he developed expertise in a number of electron, ion and x-ray microscopy techniques. His research interests lie in the development of new lithography and microscopy techniques that utilize various beam species (e.g. helium ions, neon ions, electrons) and the application thereof to the kinds of novel materials and devices that are important to users of the KNI. | ||
== List of Managed Instruments == | |||
===== Microscopy & Lithography ===== | |||
* [[ORION NanoFab: Helium, Neon & Gallium FIB | Helium, Neon & Gallium FIB: Zeiss ORION NanoFab]] | |||
* [[Nova_600 NanoLab: SEM, Ga-FIB, GIS & Omniprobe|SEM, Ga-FIB, GIS & Omniprobe: Thermo Fisher Nova 600 NanoLab]] | |||
* [[Nova 200 NanoLab: SEM, EDS & WDS | SEM, EDS & WDS: Thermo Fisher Nova 200 NanoLab]] | |||
* [[Sirion: SEM & EDS | SEM & EDS: Thermo Fisher Sirion]] | |||
* [[Quanta 200F: SEM, ESEM, Lithography & Probe Station | SEM, ESEM, Lithography & Probe Station: Thermo Fisher Quanta 200F]] | |||
* [[Tecnai TF-30: 300 kV TEM, STEM, EDS & HAADF | TEM, STEM, EDS & HAADF: Thermo Fisher Tecnai TF-30 (80-300 kV)]] | |||
* [[Tecnai TF-20: 200 kV TEM, STEM, EDS, EELS, EFTEM & Lithography | TEM, STEM, EDS, EELS, EFTEM & Lithography: Thermo Fisher Tecnai TF-20 (80-200 kV)]] | |||
* [[Dimension ICON: Atomic Force Microscope (AFM) | Atomic Force Microscope (AFM): Bruker Dimension ICON]] | |||
* [[Olympus IX81: Fluorescence Microscope | Fluorescence Microscope: Olympus IX81]] | |||
===== Support Tools for Microscopy ===== | |||
* [[Leica EM ACE600: Carbon Evaporator | Carbon: Leica EM ACE600 Carbon Evaporator]] | |||
* [[Tergeo Plus ICP- & CCP-RIE: Oxygen & Argon Plasma Cleaner | Oxygen & Argon Plasma Cleaner: PIE Scientific Tergeo Plus ICP- & CCP-RIE]] | |||
Revision as of 22:10, 27 April 2019
|
About
Matthew Hunt is the Assistant Director of Staff Research and Lead Microscopist for The Kavli Nanoscience Institute (KNI) at the California Institute of Technology. He directs research projects that are carried out by KNI technical staff, in conjunction with undergraduate researchers, with the purpose of creating new nanofabrication techniques using the KNI's leading edge instrumentation. He also manages the KNI's suite of microscopy equipment: transmission electron microscopes, scanning electron microscopes, focused ion beam systems, and an atomic force microscope.
Matt joined the KNI in 2014 after completing his PhD related to the high temperature oxidation of turbine engine materials, through which he developed expertise in a number of electron, ion and x-ray microscopy techniques. His research interests lie in the development of new lithography and microscopy techniques that utilize various beam species (e.g. helium ions, neon ions, electrons) and the application thereof to the kinds of novel materials and devices that are important to users of the KNI.
List of Managed Instruments
Microscopy & Lithography
- Helium, Neon & Gallium FIB: Zeiss ORION NanoFab
- SEM, Ga-FIB, GIS & Omniprobe: Thermo Fisher Nova 600 NanoLab
- SEM, EDS & WDS: Thermo Fisher Nova 200 NanoLab
- SEM & EDS: Thermo Fisher Sirion
- SEM, ESEM, Lithography & Probe Station: Thermo Fisher Quanta 200F
- TEM, STEM, EDS & HAADF: Thermo Fisher Tecnai TF-30 (80-300 kV)
- TEM, STEM, EDS, EELS, EFTEM & Lithography: Thermo Fisher Tecnai TF-20 (80-200 kV)
- Atomic Force Microscope (AFM): Bruker Dimension ICON
- Fluorescence Microscope: Olympus IX81