Profilometer: Keyence VK-X3000

Keyence VK-X3000 Profilometer Instrument Type Metrology Techniques Surface Profiling Staff Manager Yonghwi Kim Staff Email ykim@caltech.edu Staff Phone 626-395-5994 Reserve time on FBS Request training via FBS User Dashboard Lab Location B235 Steele Lab Phone 626-395-1539 Manufacturer Keyence Model VK-X3000

Description

The Keyence VK-X3000 is a non-contact 3D optical profilometer for surface topography and roughness measurements. It integrates three measurement principles in a single platform: white light interferometry, laser confocal scanning, and focus variation, enabling accurate 3D analysis across a wide range of materials and surface conditions.

The system measures step height, surface roughness, and feature profiles without physically contacting samples, protecting delicate or sensitive materials. It provides fully automated measurements and intuitive analysis software, offering high-resolution, versatile surface characterization for research and fabrication applications.

Applications

• Non-contact measurement of surface topography and roughness
• Step height and feature profile characterization
• Analysis of delicate or soft materials without physical contact
• 3D surface mapping for research, micro- and nanoscale structures, and quality control

Resources

SOPs

• Coming soon
• Dektak Operations Manual

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