Presentations: Difference between revisions
Jump to navigation
Jump to search
No edit summary |
|||
| Line 1: | Line 1: | ||
== Safety Presentations == | == Safety Presentations == | ||
===== By KNI Staff ===== | |||
* [https://caltech.box.com/s/yigdk8rmx0oi2mo2y5ob67bs7gmtq48y KNI Chemistry Procedures Review 2019] | * [https://caltech.box.com/s/yigdk8rmx0oi2mo2y5ob67bs7gmtq48y KNI Chemistry Procedures Review 2019] | ||
* [https://caltech.box.com/s/yigdk8rmx0oi2mo2y5ob67bs7gmtq48y KNI Chemistry Procedures Review 2016] | * [https://caltech.box.com/s/yigdk8rmx0oi2mo2y5ob67bs7gmtq48y KNI Chemistry Procedures Review 2016] | ||
Revision as of 03:35, 27 May 2019
Safety Presentations
By KNI Staff
Deposition Presentations
By KNI Staff
- Sputtering: Intro to Sputtering | Dielectric Sputter System Training
- Evaporation: CHA Mk40 E-beam Evaporator Training | KJLC Labline E-beam Evaporator Training
Microscopy Presentations
By KNI Staff
- Scanning Electron Microscopy (SEM): Principles, Techniques & Applications
- Gallium Focused Ion Beam Microscopy (Ga-FIB): Principles, Techniques & Applications
- Helium & Neon Focused Ion Beam Microscopy (He/Ne-FIB): Principles, Techniques & Applications
By Manufacturers
- Atomic Force Microscopy (AFM): Bruker's presentation on Image Quality & PeakForce Tapping
- Atomic Force Microscopy (AFM): Bruker's presentation on Quantitative NanoMechanics (QNM)