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== Safety Presentations == | == Safety Presentations == | ||
* | * [https://caltech.box.com/s/yigdk8rmx0oi2mo2y5ob67bs7gmtq48y KNI Chemistry Procedures Review 2019] | ||
* [https://caltech.box.com/s/yigdk8rmx0oi2mo2y5ob67bs7gmtq48y KNI Chemistry Procedures Review 2016] | |||
== | == Deposition Presentations == | ||
===== By KNI Staff ===== | ===== By KNI Staff ===== | ||
* | * '''Sputtering:''' [https://youtu.be/y7JbzNZwZvs Intro to Sputtering] | [https://youtu.be/MlxUnwviBiI Dielectric Sputter System Training] | ||
* '''Evaporation:''' [https://youtu.be/4K75m4V0Lq4 CHA Mk40 E-beam Evaporator Training] | [https://youtu.be/jq5M7fkgpfM KJLC Labline E-beam Evaporator Training] | |||
* | |||
== | == Microscopy Presentations == | ||
===== By KNI Staff ===== | ===== By KNI Staff ===== | ||
* [https://caltech.box.com/s/lulkj0pwm053akyya1shazg8wzgudq9f Scanning Electron Microscopy (SEM): Principles, Techniques & Applications] | |||
* [https://caltech.box.com/s/f4k8jan85n5lf6f2tutjx4rkfzjq7y68 Gallium Focused Ion Beam Microscopy (Ga-FIB): Principles, Techniques & Applications] | |||
* [https://caltech.box.com/s/ibe1nt5rd1u2kmvnfbjs2dj9lg28mch7 Helium & Neon Focused Ion Beam Microscopy (He/Ne-FIB): Principles, Techniques & Applications] | |||
===== By Manufacturers ===== | ===== By Manufacturers ===== | ||
* | * [https://caltech.box.com/s/giewllp5pybk4mdoj7g9jdvcsdk2jlpz Atomic Force Microscopy (AFM): Bruker's presentation on Image Quality & PeakForce Tapping] | ||
* [https://caltech.box.com/s/giewllp5pybk4mdoj7g9jdvcsdk2jlpz Atomic Force Microscopy (AFM): Bruker's presentation on Quantitative NanoMechanics (QNM)] | |||
== | == Ellipsometry Data Fitting Examples == | ||
===== By KNI Staff ===== | ===== By KNI Staff ===== | ||
* [https://youtu.be/M4jGUP-883U Part 1: Fitting Basics for Transparent Films] | |||
* [https://youtu.be/54w-i0R4SMA Part 2: Transparent Polymers] | |||
* [https://youtu.be/l6-uTJ-V3EU Part 3: Absorbing Films via B-Spline] | |||
* [https://youtu.be/M4jGUP-883U | |||
Revision as of 22:23, 26 May 2019
Safety Presentations
Deposition Presentations
By KNI Staff
- Sputtering: Intro to Sputtering | Dielectric Sputter System Training
- Evaporation: CHA Mk40 E-beam Evaporator Training | KJLC Labline E-beam Evaporator Training
Microscopy Presentations
By KNI Staff
- Scanning Electron Microscopy (SEM): Principles, Techniques & Applications
- Gallium Focused Ion Beam Microscopy (Ga-FIB): Principles, Techniques & Applications
- Helium & Neon Focused Ion Beam Microscopy (He/Ne-FIB): Principles, Techniques & Applications
By Manufacturers
- Atomic Force Microscopy (AFM): Bruker's presentation on Image Quality & PeakForce Tapping
- Atomic Force Microscopy (AFM): Bruker's presentation on Quantitative NanoMechanics (QNM)