Presentations: Difference between revisions
Jump to navigation
Jump to search
No edit summary |
No edit summary |
||
| Line 23: | Line 23: | ||
* [https://caltech.box.com/s/ibe1nt5rd1u2kmvnfbjs2dj9lg28mch7 Helium & Neon Focused Ion Beam Microscopy: Principles, Techniques & Applications] | * [https://caltech.box.com/s/ibe1nt5rd1u2kmvnfbjs2dj9lg28mch7 Helium & Neon Focused Ion Beam Microscopy: Principles, Techniques & Applications] | ||
== Ellipsometry Data-fitting Examples | == Ellipsometry Data-fitting Examples == | ||
* | * [https://youtu.be/M4jGUP-883U Part1: Fitting basics for transparent films] | [https://youtu.be/54w-i0R4SMA Part2: Transparent polymers] | [https://youtu.be/l6-uTJ-V3EU Part3: Absorbing Films via B-Spline] | ||
===== By Manufacturers ===== | ===== By Manufacturers ===== | ||
* [https://caltech.box.com/s/giewllp5pybk4mdoj7g9jdvcsdk2jlpz Atomic Force Microscopy: Bruker's presentation on Image Quality & PeakForce Tapping] | * [https://caltech.box.com/s/giewllp5pybk4mdoj7g9jdvcsdk2jlpz Atomic Force Microscopy: Bruker's presentation on Image Quality & PeakForce Tapping] | ||
* [https://caltech.box.com/s/giewllp5pybk4mdoj7g9jdvcsdk2jlpz Atomic Force Microscopy: Bruker's presentation on Quantitative NanoMechanics (QNM)] | * [https://caltech.box.com/s/giewllp5pybk4mdoj7g9jdvcsdk2jlpz Atomic Force Microscopy: Bruker's presentation on Quantitative NanoMechanics (QNM)] | ||
Revision as of 23:59, 23 May 2019
Safety Presentations
- Ppt 1
Lithography Presentations
By KNI Staff
- Ppt 1
By Manufacturers
- Ppt 1
Deposition Presentations
By KNI Staff
- Sputtering
- Evaporation
By Manufacturers
- Ppt 1
Microscopy Presentations
By KNI Staff
- Scanning Electron Microscopy: Principles, Techniques & Applications
- Gallium Focused Ion Beam Microscopy: Principles, Techniques & Applications
- Helium & Neon Focused Ion Beam Microscopy: Principles, Techniques & Applications
Ellipsometry Data-fitting Examples
- Part1: Fitting basics for transparent films | Part2: Transparent polymers | Part3: Absorbing Films via B-Spline