Presentations: Difference between revisions
Jump to navigation
Jump to search
No edit summary |
No edit summary |
||
Line 10: | Line 10: | ||
== Deposition Presentations == | == Deposition Presentations == | ||
===== By KNI Staff ===== | ===== By KNI Staff ===== | ||
* | * Sputtering | ||
** [https://youtu.be/y7JbzNZwZvs Intro to Sputtering] | [https://youtu.be/MlxUnwviBiI Dielectric Sputter System Training] | |||
* Evaporation | |||
** [https://youtu.be/4K75m4V0Lq4 CHA Mk40 E-beam Evaporator Training] | [https://youtu.be/jq5M7fkgpfM KJLC Labline E-beam Evaporator Training] | |||
===== By Manufacturers ===== | ===== By Manufacturers ===== | ||
* Ppt 1 | * Ppt 1 | ||
Line 19: | Line 22: | ||
* [https://caltech.box.com/s/f4k8jan85n5lf6f2tutjx4rkfzjq7y68 Gallium Focused Ion Beam Microscopy: Principles, Techniques & Applications] | * [https://caltech.box.com/s/f4k8jan85n5lf6f2tutjx4rkfzjq7y68 Gallium Focused Ion Beam Microscopy: Principles, Techniques & Applications] | ||
* [https://caltech.box.com/s/ibe1nt5rd1u2kmvnfbjs2dj9lg28mch7 Helium & Neon Focused Ion Beam Microscopy: Principles, Techniques & Applications] | * [https://caltech.box.com/s/ibe1nt5rd1u2kmvnfbjs2dj9lg28mch7 Helium & Neon Focused Ion Beam Microscopy: Principles, Techniques & Applications] | ||
== Ellipsometry Data-fitting Examples | |||
* | |||
===== By Manufacturers ===== | ===== By Manufacturers ===== | ||
* [https://caltech.box.com/s/giewllp5pybk4mdoj7g9jdvcsdk2jlpz Atomic Force Microscopy: Bruker's presentation on Image Quality & PeakForce Tapping] | * [https://caltech.box.com/s/giewllp5pybk4mdoj7g9jdvcsdk2jlpz Atomic Force Microscopy: Bruker's presentation on Image Quality & PeakForce Tapping] | ||
* [https://caltech.box.com/s/giewllp5pybk4mdoj7g9jdvcsdk2jlpz Atomic Force Microscopy: Bruker's presentation on Quantitative NanoMechanics (QNM)] | * [https://caltech.box.com/s/giewllp5pybk4mdoj7g9jdvcsdk2jlpz Atomic Force Microscopy: Bruker's presentation on Quantitative NanoMechanics (QNM)] |
Revision as of 23:57, 23 May 2019
Safety Presentations
- Ppt 1
Lithography Presentations
By KNI Staff
- Ppt 1
By Manufacturers
- Ppt 1
Deposition Presentations
By KNI Staff
- Sputtering
- Evaporation
By Manufacturers
- Ppt 1
Microscopy Presentations
By KNI Staff
- Scanning Electron Microscopy: Principles, Techniques & Applications
- Gallium Focused Ion Beam Microscopy: Principles, Techniques & Applications
- Helium & Neon Focused Ion Beam Microscopy: Principles, Techniques & Applications
== Ellipsometry Data-fitting Examples