Yonghwi Kim

Yonghwi Kim [[image:|320x373px|center|]] Title Electron and Ion Microscope Manager Responsibilities Scanning electron microscopes, focused ion beam, helium ion beam, AFM, profilometer Email ykim@caltech.edu Phone 626-395-3371 (office) Office 303 Steele

About

Role in the KNI

Yonghwi Kim is the Electron and Ion Microscope Manager for The Kavli Nanoscience Institute (KNI) at the California Institute of Technology. He oversees the daily management of the Quanta ESEM, Sirion FESEM, Nova 600 focused ion beam, Zeiss Orion Nanofab helium ion microscope, atomic force microscope, and the profilometer.

Education

Yonghwi received his Ph.D. and M.S. in Electrical Engineering from Caltech under Prof. Harry A. Atwater. Thesis title: Light modulation with vanadium dioxide-based optical devices.

List of Managed Instruments

Focused Ion Beam (FIB) Systems

• Helium, Neon & Gallium FIB: Zeiss ORION NanoFab
• SEM, Ga-FIB, GIS & Omniprobe: Thermo Fisher Nova 600 NanoLab

Scanning Electron Microscopes (SEMs)

• Nova 200 NanoLab: SEM & EDS
• Sirion: SEM & EDS
• SEM, ESEM, Lithography & Probe Station: Thermo Fisher Quanta 200F
• SEM, Ga-FIB, GIS & Omniprobe: Thermo Fisher Nova 600 NanoLab

Scanning Probe Microscopes

• Atomic Force Microscope (AFM): Bruker Dimension Icon
• Profilometer: Veeco Dektak 3ST